Scientific Program
The scientific topics and fields treated at PIXE2004 will follow the established tradition of the PIXE conferences. More emphasis will be given to encourage new developments in PIXE experiments, to support the use of recent physical data, and to improve procedures to achieve quality standards for a particular application. The official language of the Conference is English. The program of the PIXE2007 Conference will include:
Basic physical principles
• Improvements in the physical data
• Physics of inner-shell processes
• Ion beam stopping
• Background contributions
Advances in experimental devices and setup
• Development of experimental arrangements and instrumentation
• Detectors
• Target preparation
• Spectra analysis and data handling
• Automation
Use of complementary analytical techniques
• Complementary to IBA and other analytical methods
• Approaches to achieve QA/QC standards
Fields of applications
• Biology and biomedical sciences
• Environmental sciences
• Earth sciences
• Materials
• Arts and archaeology
• Quality assurance/Quality control in PIXE analyses
• Commercial services for PIXE
Invited speakers
- Gregory Lapicki USA X-ray emission, ionization by ion impact
- Keizo Ishii Japan, Brehmsstrahlung
- Kirsten Johnson USA Environmental applications
- Andres Kreiner Argentina PIXE using high-energy heavy ions
- Johnny F. Dias Brazil Materials science applications
- Ari Ide-Ektassabi Japan Biological applications
- Thomas Calligaro France Archaeometry
- Guy Demortier Belgium Use of combined techniques (PIXE and AMS)
- Noemi R. Rebollo Mexico Materials science and combined IBA methods
- Jens Höhne Germany New developments in instrumentation
- Andreas Karydas Greece New developments in instrumentation
Conference schedule
Thursday, |
Friday, |
Saturday, |
Sunday, |
Monday, |
Tuesday, |
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|---|---|---|---|---|---|---|
| 8:30-9:00 | Opening | |||||
| 9:00-9:20 | Sesion A |
Sesion E N.R. Rebollo |
Conference Trip | Sesion H K. Johnson |
Sesion K J. F. Dias |
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| 9:20-9:40 | ||||||
| 9:40-10:00 | M. Behar | A. Vaggelli | K. Dias da Cunha | C. Jeynes | ||
| 10:00-10:20 | S. Fazinic | N. Grassi | T.A. Cahill | B.L. Doyle | ||
| 10:20-10:50 | Coffee break |
Coffe break |
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| 10:50-11:10 | Sesion B K. Ishii |
Sesion F T. Calligaro |
Sesion I A.S. Kerr |
Sesion L A. Karydas |
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| 11:10-11:30 | W. Maenhaut | |||||
| 11:30-11:50 | Z. Szökefalvi-Nagy | Z. Smit | J. García-López | D. Sokaras | ||
| 11:50-12:10 | D.D. Cohen | L. Beck | C. Solís | V. Havranek | ||
| 12:10-12:30 | R. Correa-Devés | M. Kos | G. Pappalardo | R.G. Flocchini | ||
| 12:30-14:00 | Lunch |
Lunch |
Closing | |||
| 14:00-14:20 | Sesion C A. Kreiner |
Sesion G G. Demortier |
Sesion J J. Höhne |
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| 14:20-14:40 | ||||||
| 14:40-15:00 | E. Garman | G.W. Grime | F. Lucarelli | |||
| 15:00-15:20 | W. Przybilowicz | D. Strivay | Workshop on GUPIX for Windows | |||
| 15:20-15:40 | R. Seigele | L. Pappalardo | ||||
| 15:40-16:10 | Coffee break |
Coffee break |
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| 16:10-16:30 | Sesion D A.I. Ektessabi |
Poster 1 | Poster 2 | |||
| 16:30-16:50 | ||||||
| 16:50-17:10 | Registration | C.A. Pineda | ||||
| 17:10-17:30 | V. Purewal | |||||
| 17:30-17:50 | J. Meszjaz-Przybylowicz | |||||
| 17:50-18:10 | K. Sera | Round Table: |
Round Table: |
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| 19:00 | Reception | Welcome Cocktail | Conference Banquet | |||
Basic Physical Principles |
Archaeometry | |||||
Complementary Techniques |
Environmental Sciences | |||||
Biological and Biomedical applications |
Advances in experimental devices | |||||
Materials Science |
Workshop | |||||
Book of abstracts
The book of abstracts can be found here.
Poster Size
Maximun poster size: 1 m (width) x 1.60 m (height).
Conference Proceedings
Proceedings for all presented works in PIXE 2007 will be published in electronic format. There will be a rigorous refereeing process, in order to maintain the scientific level of previous PIXE conferences. The proceedings will also be available from the web site of the conference. Moreover, the International Advisory Committee will select a limited number of papers to be published in a special issue of X-ray Spectrometry (John Wiley and Sons, Ltd.).
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